Scanning probe microscope (SPM) can scan sample surfaces with an extremely sharp probe to observe their three-dimensional image of surfaces at high magnifications.

Features Highlight

    • High performance, faster speeds, and easier operation
    • High stability and high throughput with sample placement without stopping laser irradiation, outstanding irradiation stability and significantly shorter analysis time.
    • Offers wide variety of 3D rendering functions and analysis of 3D cross-section profiles
    • Support use of mouse operations that allows magnification of images in a variety of directions and angles